• RM3-AR Test Unit auto-ranging combined current source and meter with software



• Multiposition Four-Point Probe that allows wafers to be mechanically indexed to up to 9 preset locations with 1mm accuracy on wafers up to 8 inches in diameter



• Multi Height Four-Point Probe that allows samples of widely varying dimensions to be probed.



• Microposition Four-Point Probe for making measurements on small samples requiring high tip placement accuracy.



• Multi Height Microposition Four-Point Probe providing the features of both the Multi Height Probe and the MIcroposition Probe in one system.



• Universal Four-Point Probe useful for research applications



• Hand-Applied Four-Point Probe for making measurements on large substrates, flat panels, ingots, etc.



• HM21 Hand Held Four-Point Probe Meter with on-board NVM to store up to 50 measurements, includes software. Ideal for making a wide range of measurements when a portable unit is needed.



• Jandel Four Point Probe Heads for all known systems



• Jandel FAQ Answers to fequently asked questions



• Notes on Making Four Point Probe Measurements Using Jandel Equipment

BRIDGE Technology is an authorized representative of JANDEL Engineering Ltd.