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Application Measurement of resistivity of samples by the four point technique. From wafers to ingots up to 10" deep by 6" high. Width is limited only by need to support the ends. Construction The unit comprises a hard anodised aluminium alloy plate 8mm thick with a vertical column, on which is mounted a Jandel cylindrical probe with a raising and lowering mechanism. You can slide this assembly up or down the column and clamp it in position. If desired an adjustable micro-switch enables an interlock to operate prevent sparking when the probe is lowered onto the specimen. The connection to a measuring system is made via a 9-way socket on the raising and lowering assembly. The probe head can be changed by releasing a single clamp screw and unplugging from a 5-way socket. The probe head / lead is identical to that used on the Jandel Multiposition probe. ![]() |
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For additional versatility, the optional Multi Height Microposition Probe includes a removeable X-Y stage for precision probe tip placement. |
Click here to download a document regarding the light shroud (the "Large Shroud") available for the Jandel Multi Height Microposition Probe for use in blocking light from sample up to 2" in diameter [150K PDF file] |
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A complete four point probing system consists of the Multi Height Probe shown above, combined with the RM3 Test Unit |
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| Four-Point-Probes is a division of Bridge Technology. To request further information please call Bridge Technology at (480) 988-2256 or send e-mail to Larry Bridge at: sales@bridgetec.com |
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